Precision Contacts

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Leaded Test Sockets

LEADED TEST
SOCKETS

FOR SOIC, TSSOP, MSOP, ETC.

INNOVATIVE TECHNOLOGY DELIVERS THE LOWEST COST PER TEST AND HIGHEST TEST YIELDS.
For testing surface-mount devices, including TSSOP, MSOP, and SOIC, our leaded test sockets and contactors are designed to provide accurate and consistent results to meet your test requirements. Low and consistent contact resistance by way of appropriate contact force and short lead length makes the contacts versatile and long lasting.
Leaded Test Socket

It’s What’s Inside That Counts…

The contacts that go into our TSSOP, MSOP, and SOIC test socket and contactor products set Precision Contacts’ test solutions apart from the rest.

  • High yield and excellent reliability for the life of the contacts
  • One-piece modular design for fast, accurate replacement
  • Extreme current capabilities
  • In-house custom design capabilities for faster time-to-market
  • Any leaded/surface device: SOIC, TSSOP, MSOP, QSOP, SOT
CONTACTS FOR SOIC, TSSOP, MSOP, ETC.

CONTACTS FOR SOIC, TSSOP, MSOP, ETC.

Made for high-volume production testing, these workhorse kelvin contacts provide unsurpassed test yields and life cycles. Our most popular and widely used contacts, they are available as a complete contactor assembly or individually for your own in-house test solution.

  • Consistently low contact resistance throughout the life of the contacts
  • Overlapping-cantilever beam technology for extreme versatility and customizability
  • Designed for any leaded surface-mount device
  • For use in all plunge-to-board, belly-bar, and turret-head test handlers
  • Flexibility and user-friendly design equals low cost of ownership

CONTACTS FOR SOIC, TSSOP, MSOP, ETC.

G2KC CONTACTS AND CONTACTORS

Our most versatile and widely used contacts. Designed for finepitch surface-mount devices, our leaded kelvin contacts are available in a multitude of confgurations to address your specifi product requirements.

  • Integrated into Precision Contacts IC test sockets and contactors
  • Used in customers’ in-house test solutions
  • For all types of leaded devices and automated test handlers
SD CONTACTS FOR SOT, TSOT, AND SC70 DEVICES

SD CONTACTS FOR SOT, TSOT, AND SC70 DEVICES

Handlers delivering high device throughputs require a contact that can maximize speed and reduce downtime. The SD contact element’s durable design provides excellent test yields and extremely high life cycles.

  • Made to work in all turret-head and plunge-to handlers
  • Side-by-side contact design to deliver excellent kelvin results
  • One-piece construction for easy, fast, and precise replacement
  • Built-in overdrive protection and device precisor
  • Replaceable device insert to ensure exact device placement in socket
  • Use as a redundant contact for increased yields and greater life cycles